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Descriptor English: Microscopy, Atomic Force
Descriptor Spanish: Microscopía de Fuerza Atómica
Descriptor microscopía de fuerza atómica
Entry term(s) microscopía de fuerza
microscopía de fuerza de barrido
Scope note: Tipo de microscopía de sonda de barrido en la que la sonda se desplaza sistemáticamente sobre la superficie de la muestra barrida con un patrón matricial. La posición vertical se registra a medida que un muelle unido a la sonda, sube y baja en respuesta a los picos y valles de la superficie. Estas deflexiones producen un mapa topográfico de la muestra.
Descriptor Portuguese: Microscopia de Força Atômica
Descriptor French: Microscopie à force atomique
Entry term(s): Atomic Force Microscopies
Atomic Force Microscopy
Force Microscopies
Force Microscopies, Scanning
Force Microscopy
Force Microscopy, Scanning
Microscopies, Atomic Force
Microscopies, Force
Microscopies, Scanning Force
Microscopy, Force
Microscopy, Scanning Force
Scanning Force Microscopies
Scanning Force Microscopy
Tree number(s): E01.370.350.515.666.400
E05.595.666.400
RDF Unique Identifier: https://id.nlm.nih.gov/mesh/D018625
Scope note: A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.
Allowable Qualifiers: CL classification
EC economics
ES ethics
HI history
IS instrumentation
MT methods
SN statistics & numerical data
ST standards
TD trends
VE veterinary
Previous Indexing: Microscopy (1988-1994)
Microscopy, Scanning Tunneling (1988-1994)
Public MeSH Note: 95
History Note: 95
Related: Microscopy, Scanning Tunneling MeSH
DeCS ID: 32147
Unique ID: D018625
NLM Classification: QH 212.A78
Documents indexed in the Virtual Health Library (VHL): Click here to access the VHL documents
Date Established: 1995/01/01
Date of Entry: 1994/04/16
Revision Date: 2004/07/07
Microscopy, Atomic Force - Preferred
Concept UI M0027912
Scope note A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.
Preferred term Microscopy, Atomic Force
Entry term(s) Atomic Force Microscopies
Atomic Force Microscopy
Force Microscopies
Force Microscopies, Scanning
Force Microscopy
Force Microscopy, Scanning
Microscopies, Atomic Force
Microscopies, Force
Microscopies, Scanning Force
Microscopy, Force
Microscopy, Scanning Force
Scanning Force Microscopies
Scanning Force Microscopy



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