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Descriptor English: Microscopy, Electron, Scanning
Descriptor Spanish: Microscopía Electrónica de Rastreo
Descriptor microscopía electrónica de barrido
Entry term(s) microscopía electrónica de rastreo
Scope note: Microscopía en la que el objeto es examinado directamente mediante un haz de electrones que barre la muestra punto a punto. La imagen es construida por detección de los productos de las interacciones con la muestra, que son proyectadas por encima del plano de la muestra, como electrones dispersados. Aunque la MICROSCOPÍA ELECTRÓNICA DE BARRIDO Y TRANSMISIÓN también barre la muestra punto a punto con el haz de electrones, la imagen es construida por detección de electrones o sus productos de interacción, que son transmitidos a través del plano de la muestra, de modo que es una forma de MICROSCOPÍA ELECTRÓNICA DE TRANSMISISIÓN.
Descriptor Portuguese: Microscopia Eletrônica de Varredura
Descriptor French: Microscopie électronique à balayage
Entry term(s): Electron Microscopies, Scanning
Electron Microscopy, Scanning
Electron Scanning Microscopies
Electron Scanning Microscopy
Microscopies, Electron Scanning
Microscopies, Scanning Electron
Microscopy, Electron Scanning
Microscopy, Scanning Electron
Scanning Electron Microscopies
Scanning Electron Microscopy
Scanning Microscopies, Electron
Scanning Microscopy, Electron
Tree number(s): E01.370.350.515.402.541
E05.595.402.541
RDF Unique Identifier: https://id.nlm.nih.gov/mesh/D008855
Scope note: Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY.
Annotation: do not confuse with MICROSCOPY, ELECTRON, SCANNING TRANSMISSION or STEM
Allowable Qualifiers: CL classification
EC economics
ES ethics
HI history
IS instrumentation
MT methods
SN statistics & numerical data
ST standards
TD trends
VE veterinary
Previous Indexing: Microscopy, Electron (1966-1968)
Public MeSH Note: 72
History Note: 72(69)
Related: Corrosion Casting MeSH
DeCS ID: 23316
Unique ID: D008855
NLM Classification: QH 212.S3
Documents indexed in the Virtual Health Library (VHL): Click here to access the VHL documents
Date Established: 1972/01/01
Date of Entry: 1999/01/01
Revision Date: 2016/02/08
Microscopy, Electron, Scanning - Preferred
Concept UI M0013811
Scope note Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY.
Preferred term Microscopy, Electron, Scanning
Entry term(s) Electron Microscopies, Scanning
Electron Microscopy, Scanning
Electron Scanning Microscopies
Electron Scanning Microscopy
Microscopies, Electron Scanning
Microscopies, Scanning Electron
Microscopy, Electron Scanning
Microscopy, Scanning Electron
Scanning Electron Microscopies
Scanning Electron Microscopy
Scanning Microscopies, Electron
Scanning Microscopy, Electron



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