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Descriptor English: Microscopy, Electron
Descriptor Spanish: Microscopía Electrónica
Descriptor microscopía electrónica
Scope note: Microscopía que utiliza un haz de electrones, en lugar de luz, para visualizar la muestra, permitiendo de ese modo mucha mas ampliación. Las interacciones de los ELECTRONES con los materiales se utilizan para proporcionar información acerca de la estructura fina del material. En la MICROSCOPÍA ELECTRÓNICA DE TRANSMISIÓN las reacciones de los electrones transmitidos a través de la muestra forman una imagen. En la MICROSCOPÍA ELECTRÓNICA DE BARRIDO el haz de electrones incide sobre la muestra en un ángulo no perpendicular y la imagen se forma a partir de las reacciones que ocurren por encima del plano de la muestra.
Descriptor Portuguese: Microscopia Eletrônica
Descriptor French: Microscopie électronique
Entry term(s): Electron Microscopy
Tree number(s): E01.370.350.515.402
E05.595.402
SP4.122.006.057.488.724
RDF Unique Identifier: https://id.nlm.nih.gov/mesh/D008854
Scope note: Microscopy using an electron beam, instead of light, to visualize the sample, thereby allowing much greater magnification. The interactions of ELECTRONS with specimens are used to provide information about the fine structure of that specimen. In TRANSMISSION ELECTRON MICROSCOPY the reactions of the electrons that are transmitted through the specimen are imaged. In SCANNING ELECTRON MICROSCOPY an electron beam falls at a non-normal angle on the specimen and the image is derived from the reactions occurring above the plane of the specimen.
Annotation: general or unspecified; prefer specifics
Allowable Qualifiers: CL classification
EC economics
ES ethics
HI history
IS instrumentation
MT methods
SN statistics & numerical data
ST standards
TD trends
VE veterinary
DeCS ID: 23315
Unique ID: D008854
Documents indexed in the Virtual Health Library (VHL): Click here to access the VHL documents
Date Established: 1966/01/01
Date of Entry: 1999/01/01
Revision Date: 2004/07/28
Microscopy, Electron - Preferred
Concept UI M0013809
Scope note Microscopy using an electron beam, instead of light, to visualize the sample, thereby allowing much greater magnification. The interactions of ELECTRONS with specimens are used to provide information about the fine structure of that specimen. In TRANSMISSION ELECTRON MICROSCOPY the reactions of the electrons that are transmitted through the specimen are imaged. In SCANNING ELECTRON MICROSCOPY an electron beam falls at a non-normal angle on the specimen and the image is derived from the reactions occurring above the plane of the specimen.
Preferred term Microscopy, Electron
Entry term(s) Electron Microscopy



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