| Descriptor English: | Volume Electron Microscopy | ||||||
| Descriptor Spanish: |
Microscopía Electrónica de Volumen
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| Descriptor Portuguese: | Microscopia Eletrônica de Volume | ||||||
| Descriptor French: | Without translation | ||||||
| Entry term(s): |
EM, Volume Electron Microscopy, Volume FIB-SEM Focused Ion Beam SEM Focused Ion Beam Scanning Electron Microscopy SBF-SEM SEM, Serial Block-Face Serial Block Face SEM Serial Block Face Scanning Electron Microscopy Serial Block-Face SEM Serial Block-Face SEMs Serial Block-Face Scanning Electron Microscopy Serial Sectioning TEM Serial Sectioning TEMs Serial Sectioning Transmission Electron Microscopy TEM, Serial Sectioning TEMs, Serial Sectioning Volume EM Volume Electron Microscopies ssTEM vEM Volume Electron Microscopy |
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| Tree number(s): |
E01.370.350.515.402.812 E05.595.402.812 L01.224.308.705 |
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| RDF Unique Identifier: | https://id.nlm.nih.gov/mesh/D000094443 | ||||||
| Scope note: | Electron microscopy techniques designed to reconstruct 3-D images at micrometer volume scales at nanometer (nm) level resolutions. Volume electron microscopy uses various techniques to render, segment and reconstruct 3-D images from stacked sequential 2-D images of incremental z-planes. |
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| Allowable Qualifiers: |
CL classification EC economics ES ethics HI history IS instrumentation MT methods SN statistics & numerical data ST standards TD trends VE veterinary |
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| Previous Indexing: |
Microscopy, Electron (1983-2022) |
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| Public MeSH Note: | 2023 |
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| History Note: | 2023 |
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| DeCS ID: | 60244 | ||||||
| Unique ID: | D000094443 | ||||||
| Documents indexed in the Virtual Health Library (VHL): | Click here to access the VHL documents | ||||||
| Date Established: | 2023/01/01 | ||||||
| Date of Entry: | 2022/07/12 | ||||||
| Revision Date: | 2022/07/12 |
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ANALYTICAL, DIAGNOSTIC AND THERAPEUTIC TECHNIQUES, AND EQUIPMENT
Diagnosis [E01]Diagnosis -
ANALYTICAL, DIAGNOSTIC AND THERAPEUTIC TECHNIQUES, AND EQUIPMENT
Investigative Techniques [E05]Investigative Techniques -
INFORMATION SCIENCE
Information Science [L01]Information Science
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Volume Electron Microscopy
- Preferred
Focused Ion Beam Scanning Electron Microscopy
- Narrower
Serial Sectioning Transmission Electron Microscopy
- Narrower
Serial Block-Face Scanning Electron Microscopy
- Narrower
| Concept UI |
M000755966 |
| Scope note | Electron microscopy techniques designed to reconstruct 3-D images at micrometer volume scales at nanometer (nm) level resolutions. Volume electron microscopy uses various techniques to render, segment and reconstruct 3-D images from stacked sequential 2-D images of incremental z-planes. |
| Preferred term | Volume Electron Microscopy |
| Entry term(s) |
EM, Volume Electron Microscopy, Volume Volume EM Volume Electron Microscopies vEM Volume Electron Microscopy |
| Concept UI |
M000755969 |
| Preferred term | Focused Ion Beam Scanning Electron Microscopy |
| Entry term(s) |
FIB-SEM Focused Ion Beam SEM |
| Concept UI |
M000755967 |
| Preferred term | Serial Sectioning Transmission Electron Microscopy |
| Entry term(s) |
Serial Sectioning TEM Serial Sectioning TEMs TEM, Serial Sectioning TEMs, Serial Sectioning ssTEM |
| Concept UI |
M000755968 |
| Preferred term | Serial Block-Face Scanning Electron Microscopy |
| Entry term(s) |
SBF-SEM SEM, Serial Block-Face Serial Block Face SEM Serial Block Face Scanning Electron Microscopy Serial Block-Face SEM Serial Block-Face SEMs |
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