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Descriptor English: Spectrometry, Mass, Secondary Ion
Descriptor Spanish: Espectrometría de Masa de Ion Secundario
Descriptor espectrometría de masas por iones secundarios
Entry term(s) espectroscopía de masas de ión secundario
microscopía por EMIS
microscopía por espectrometría de masa de ión secundario
Scope note: Técnica de espectrometría de masas que se usa para el análisis químico microscópico. Un rayo de iones primarios con una energía de 5-20 kiloelectronvoltios (keV) bombardea un pequeño punto de la superficie de la muestra bajo condiciones de vacío ultra alto. Iones secundarios positivos y negativos lanzados desde la superficie se analizan en un espectrómetro de masas respecto a su relación masa/carga. Se puede generar una imagen digital de los rayos secundarios y puede medirse su intensidad. La imagen iónica puede relacionarse con las imágenes de la luz u otras imágenes microscópicas, proporcionando instrumentos útiles para estudios moleculares y de acción farmacológica.
Descriptor Portuguese: Espectrometria de Massa de Íon Secundário
Descriptor French: Spectrométrie de masse d'ions secondaires
Entry term(s): Mass Spectrometry, Secondary Ion
Mass Spectroscopy, Secondary Ion
SIMS Microscopy
Secondary Ion Mass Spectrometry
Secondary Ion Mass Spectrometry Microscopy
Secondary Ion Mass Spectroscopy
Secondary Ion Mass Spectroscopy Microscopy
Spectroscopy, Mass, Secondary Ion
Tree number(s): E05.196.566.760
RDF Unique Identifier: https://id.nlm.nih.gov/mesh/D018629
Scope note: A mass-spectrometric technique that is used for microscopic chemical analysis. A beam of primary ions with an energy of 5-20 kiloelectronvolts (keV) bombards a small spot on the surface of the sample under ultra-high vacuum conditions. Positive and negative secondary ions sputtered from the surface are analyzed in a mass spectrometer in regards to their mass-to-charge ratio. Digital imaging can be generated from the secondary ion beams and their intensity can be measured. Ionic images can be correlated with images from light or other microscopy providing useful tools in the study of molecular and drug actions.
Annotation: for SIMS microscopy, coordinate with type of microscopy
Allowable Qualifiers: CL classification
EC economics
ES ethics
HI history
IS instrumentation
MT methods
SN statistics & numerical data
ST standards
TD trends
VE veterinary
Previous Indexing: Spectrum Analysis, Mass (1976-1994)
Public MeSH Note: 95
History Note: 95
Entry Version: SPECTROMETRY MASS SECOND ION
DeCS ID: 32021
Unique ID: D018629
Documents indexed in the Virtual Health Library (VHL): Click here to access the VHL documents
Date Established: 1995/01/01
Date of Entry: 1994/05/12
Revision Date: 2006/07/05
Spectrometry, Mass, Secondary Ion - Preferred
Concept UI M0027922
Scope note A mass-spectrometric technique that is used for microscopic chemical analysis. A beam of primary ions with an energy of 5-20 kiloelectronvolts (keV) bombards a small spot on the surface of the sample under ultra-high vacuum conditions. Positive and negative secondary ions sputtered from the surface are analyzed in a mass spectrometer in regards to their mass-to-charge ratio. Digital imaging can be generated from the secondary ion beams and their intensity can be measured. Ionic images can be correlated with images from light or other microscopy providing useful tools in the study of molecular and drug actions.
Preferred term Spectrometry, Mass, Secondary Ion
Entry term(s) Mass Spectrometry, Secondary Ion
Mass Spectroscopy, Secondary Ion
SIMS Microscopy
Secondary Ion Mass Spectrometry
Secondary Ion Mass Spectrometry Microscopy
Secondary Ion Mass Spectroscopy
Secondary Ion Mass Spectroscopy Microscopy
Spectroscopy, Mass, Secondary Ion



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