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Descriptor English: Electron Probe Microanalysis
Descriptor Spanish: Microanálisis por Sonda Electrónica
Descriptor microanálisis por sonda electrónica
Entry term(s) espectrometría de emisión de rayos X con microscopía electrónica
espectrometría de emisión de rayos X con sonda electrónica
microanálisis por rayos X
microanálisis por rayos X con microscopía electrónica
microanálisis por rayos X con sonda electrónica
microscopía electrónica con microanálisis de rayos X
Scope note: Identificación y medición de ELEMENTOS y de su localización basada en el hecho de que los RAYOS X emitidos por un elemento excitado por un haz de electrones tiene una longitud de onda característica y una intensidad relacionada con su concentración. Se lleva a cabo con un microscopio electrónico equipado con un espectrómetro de rayos x, en modo de barrido o de transmisión.
Descriptor Portuguese: Microanálise por Sonda Eletrônica
Descriptor French: Microanalyse par sonde électronique
Entry term(s): Electron Probe Microanalyses
Microanalyses, Electron Probe
Microanalysis, Electron Probe
Microanalysis, X-Ray
Microscopy, Electron, X-Ray Microanalysis
Probe Microanalyses, Electron
Probe Microanalysis, Electron
Spectrometry, X Ray Emission, Electron Microscopic
Spectrometry, X Ray Emission, Electron Probe
Spectrometry, X-Ray Emission, Electron Microscopic
Spectrometry, X-Ray Emission, Electron Probe
X Ray Emission Spectrometry, Electron Microscopic
X Ray Emission Spectrometry, Electron Probe
X Ray Microanalysis
X Ray Microanalysis, Electron Microscopic
X Ray Microanalysis, Electron Probe
X-Ray Emission Spectrometry, Electron Microscopic
X-Ray Emission Spectrometry, Electron Probe
X-Ray Microanalysis
X-Ray Microanalysis, Electron Microscopic
X-Ray Microanalysis, Electron Probe
Tree number(s): E01.370.350.515.402.250
E05.196.867.800.360
E05.595.402.250
E05.799.830.360
RDF Unique Identifier: https://id.nlm.nih.gov/mesh/D004577
Scope note: Identification and measurement of ELEMENTS and their location based on the fact that X-RAYS emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It is performed with an electron microscope fitted with an x-ray spectrometer, in scanning or transmission mode.
Allowable Qualifiers: CL classification
EC economics
ES ethics
HI history
IS instrumentation
MT methods
SN statistics & numerical data
ST standards
TD trends
VE veterinary
Previous Indexing: Electrons (1966)
Spectrum Analysis (1966)
Public MeSH Note: 70
History Note: 70(67)
Entry Version: ELECTRON PROBE MICROANAL
Related: Nuclear Microscopy MeSH
DeCS ID: 4649
Unique ID: D004577
NLM Classification: QD 117.E42
Documents indexed in the Virtual Health Library (VHL): Click here to access the VHL documents
Date Established: 1970/01/01
Date of Entry: 1999/01/01
Revision Date: 2012/07/03
Electron Probe Microanalysis - Preferred
Concept UI M0007193
Scope note Identification and measurement of ELEMENTS and their location based on the fact that X-RAYS emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It is performed with an electron microscope fitted with an x-ray spectrometer, in scanning or transmission mode.
Preferred term Electron Probe Microanalysis
Entry term(s) Electron Probe Microanalyses
Microanalyses, Electron Probe
Microanalysis, Electron Probe
Microanalysis, X-Ray
Microscopy, Electron, X-Ray Microanalysis
Probe Microanalyses, Electron
Probe Microanalysis, Electron
Spectrometry, X Ray Emission, Electron Microscopic
Spectrometry, X Ray Emission, Electron Probe
Spectrometry, X-Ray Emission, Electron Microscopic
Spectrometry, X-Ray Emission, Electron Probe
X Ray Emission Spectrometry, Electron Microscopic
X Ray Emission Spectrometry, Electron Probe
X Ray Microanalysis
X Ray Microanalysis, Electron Microscopic
X Ray Microanalysis, Electron Probe
X-Ray Emission Spectrometry, Electron Microscopic
X-Ray Emission Spectrometry, Electron Probe
X-Ray Microanalysis
X-Ray Microanalysis, Electron Microscopic
X-Ray Microanalysis, Electron Probe



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