Search
Descriptor in English: Microscopy, Electron, Scanning Transmission
Descriptor in Spanish: Microscopía Electrónica de Transmisión de Rastreo
Descriptor in Portuguese: Microscopia Eletrônica de Transmissão e Varredura
Descriptor in French: Microscopie électronique en transmission à balayage
Entry term(s): Electron Microscopy, Scanning Transmission
STEM
Scanning Transmission Electron Microscopy
Tree number(s): E01.370.350.515.402.580.480
E05.595.402.580.480
Scope note: A type of TRANSMISSION ELECTRON MICROSCOPY in which the object is examined directly by an extremely narrow electron beam scanning the specimen point-by-point and using the reactions of the electrons that are transmitted through the specimen to create the image. It should not be confused with SCANNING ELECTRON MICROSCOPY.
Annotation: do not confuse with MICROSCOPY, ELECTRON, SCANNING nor with MICROSCOPY, ELECTRON, TRANSMISSION; since the techniques have different applications, do not interpret: if in doubt, use words of author
Allowable Qualifiers: CL classification
EC economics
ES ethics
HI history
IS instrumentation
MT methods
SN statistics & numerical data
ST standards
TD trends
VE veterinary
History Note: 93
DeCS UI: 30656
Descriptor UI: D017348
Date Established: 1993/01/01
Date of Entry: 1992/05/18
Revision Date: 2005/06/30
Microscopy, Electron, Scanning Transmission - Preferred
Concept UI M0026341
Scope note A type of TRANSMISSION ELECTRON MICROSCOPY in which the object is examined directly by an extremely narrow electron beam scanning the specimen point-by-point and using the reactions of the electrons that are transmitted through the specimen to create the image. It should not be confused with SCANNING ELECTRON MICROSCOPY.
Preferred term Microscopy, Electron, Scanning Transmission
Entry term(s) Electron Microscopy, Scanning Transmission
STEM
Scanning Transmission Electron Microscopy



We want your feedback on the new DeCS / MeSH website

We invite you to complete a survey that will take no more than 3 minutes.


Go to survey