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Descriptor English: Microscopy, Electron, Scanning Transmission
Descriptor Spanish: Microscopía Electrónica de Transmisión de Rastreo
Descriptor microscopía electrónica de transmisión y barrido
Entry term(s) METB
Scope note: Tipo de MICROSCOPÍA ELECTRÓNICA DE TRANSMISIÓN en la que el objeto es examinado directamente por un rayo extremadamente estrecho que barre la muestra punto por punto y utiliza las reacciones de los electrones que son transmitidos a través de la muestra para crear la imagen. No debe confundirse con la MICROSCOPÍA ELECTRÓNICA DE BARRIDO.
Descriptor Portuguese: Microscopia Eletrônica de Transmissão e Varredura
Descriptor French: Microscopie électronique en transmission à balayage
Entry term(s): Electron Microscopy, Scanning Transmission
STEM
Scanning Transmission Electron Microscopy
Tree number(s): E01.370.350.515.402.580.480
E05.595.402.580.480
RDF Unique Identifier: https://id.nlm.nih.gov/mesh/D017348
Scope note: A type of TRANSMISSION ELECTRON MICROSCOPY in which the object is examined directly by an extremely narrow electron beam scanning the specimen point-by-point and using the reactions of the electrons that are transmitted through the specimen to create the image. It should not be confused with SCANNING ELECTRON MICROSCOPY.
Annotation: do not confuse with MICROSCOPY, ELECTRON, SCANNING nor with MICROSCOPY, ELECTRON, TRANSMISSION; since the techniques have different applications, do not interpret: if in doubt, use words of author
Allowable Qualifiers: CL classification
EC economics
ES ethics
HI history
IS instrumentation
MT methods
SN statistics & numerical data
ST standards
TD trends
VE veterinary
Previous Indexing: Microscopy, Electron, Scanning (1969-1992)
Public MeSH Note: 93
History Note: 93
DeCS ID: 30656
Unique ID: D017348
Documents indexed in the Virtual Health Library (VHL): Click here to access the VHL documents
Date Established: 1993/01/01
Date of Entry: 1992/05/18
Revision Date: 2005/06/30
Microscopy, Electron, Scanning Transmission - Preferred
Concept UI M0026341
Scope note A type of TRANSMISSION ELECTRON MICROSCOPY in which the object is examined directly by an extremely narrow electron beam scanning the specimen point-by-point and using the reactions of the electrons that are transmitted through the specimen to create the image. It should not be confused with SCANNING ELECTRON MICROSCOPY.
Preferred term Microscopy, Electron, Scanning Transmission
Entry term(s) Electron Microscopy, Scanning Transmission
STEM
Scanning Transmission Electron Microscopy



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