Descriptor English: | Microscopy, Electron | ||||
Descriptor Spanish: |
Microscopía Electrónica
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Descriptor Portuguese: | Microscopia Eletrônica | ||||
Descriptor French: | Microscopie électronique | ||||
Entry term(s): |
Electron Microscopy |
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Tree number(s): |
E01.370.350.515.402 E05.595.402 |
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RDF Unique Identifier: | https://id.nlm.nih.gov/mesh/D008854 | ||||
Scope note: | Microscopy using an electron beam, instead of light, to visualize the sample, thereby allowing much greater magnification. The interactions of ELECTRONS with specimens are used to provide information about the fine structure of that specimen. In TRANSMISSION ELECTRON MICROSCOPY the reactions of the electrons that are transmitted through the specimen are imaged. In SCANNING ELECTRON MICROSCOPY an electron beam falls at a non-normal angle on the specimen and the image is derived from the reactions occurring above the plane of the specimen. |
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Annotation: | general or unspecified; prefer specifics |
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Allowable Qualifiers: |
CL classification EC economics ES ethics HI history IS instrumentation MT methods SN statistics & numerical data ST standards TD trends VE veterinary |
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DeCS ID: | 23315 | ||||
Unique ID: | D008854 | ||||
Documents indexed in the Virtual Health Library (VHL): | Click here to access the VHL documents | ||||
Date Established: | 1966/01/01 | ||||
Date of Entry: | 1999/01/01 | ||||
Revision Date: | 2004/07/28 |
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ANALYTICAL, DIAGNOSTIC AND THERAPEUTIC TECHNIQUES, AND EQUIPMENT
Diagnosis [E01]Diagnosis -
ANALYTICAL, DIAGNOSTIC AND THERAPEUTIC TECHNIQUES, AND EQUIPMENT
Investigative Techniques [E05]Investigative Techniques
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Microscopy, Electron
- Preferred
Concept UI |
M0013809 |
Scope note | Microscopy using an electron beam, instead of light, to visualize the sample, thereby allowing much greater magnification. The interactions of ELECTRONS with specimens are used to provide information about the fine structure of that specimen. In TRANSMISSION ELECTRON MICROSCOPY the reactions of the electrons that are transmitted through the specimen are imaged. In SCANNING ELECTRON MICROSCOPY an electron beam falls at a non-normal angle on the specimen and the image is derived from the reactions occurring above the plane of the specimen. |
Preferred term | Microscopy, Electron |
Entry term(s) |
Electron Microscopy |
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